high-NA EUV
Every lithography tool faces the same limit: it can only print features as fine as its light lets it. Ordinary EUV already uses very short 13.5nm light, but the smallest thing a lens can resolve also depends on how wide a cone of that light it can gather and focus, a number called the numerical aperture (NA). Think of it like a camera lens: a wider aperture collects more of the image-forming rays and brings finer detail into focus. High-NA EUV widens that cone from today's 0.33 to 0.55, which sharpens resolution by roughly a third. That matters because the rungs below keep demanding tighter pitches, and each generation of EUV buys you another shrink before you have to fall back on slow, expensive multi-patterning tricks.
There is no free lunch, though. To bend that wider cone of light, the optics use larger, asymmetric mirrors, and the physics of that design shrinks the exposure field, the patch of wafer printed in one shot, to about half the area of a standard EUV tool. So for big chips that don't fit in the smaller field, the design must be split and printed in pieces, then carefully stitched together at the seam, an extra step earlier EUV tools didn't need. High-NA machines are also enormous and cost roughly double a standard EUV scanner, so fabs reserve them for the few critical layers where the finer resolution genuinely pays off, while everything else stays on cheaper tools.
High-NA EUV (NA 0.55) is just entering production-readiness around the most advanced nodes; it extends single-exposure patterning but the half-field and stitching trade-offs mean it complements rather than fully replaces standard 0.33-NA EUV.